LEED / Auger (AES) Spectrometers
- Full Flange Size LEED / AES Spectrometer – LEED 800: Overview | Product Page
- Compact LEED / AES Spectrometer – LEED 600: Overview | Product Page
- LEED / AES w. Gain Power of Microchannel Plates – LEED 800 MCP: Overview | Product Page
- Compact LEED / AES w. Gain Power of Microchannel Plates – LEED 600 MCP: Overview | Product Page
- Miniature LEED with Integral Shutter – LEED 450: Overview | Product Page
- Miniature LEED with Integral Shutter – LEED 450-MAX: Overview | Product Page
- FemtoLEED with Integral Shutter – FemtoLEED DLD L800: Overview | Product Page
- FemtoLEED with Integral Shutter – FemtoLEED DLD L1000: Overview | Product Page
- Nano-Depth Composition Analyzer – NDC600: Overview | Product Page
LEED 800 (Model BDL800IR)
Full Flange Size LEED for Higher Angular and Energy Resolution
Figure 2. MultiLEED Software. 
Figure 3. AES Software. 
Figure 4. LEED pattern of a Silicon (111) sample with 120 eV beam energy. -120_eV.jpg)
Figure 5. LEED pattern of Strontium Titanate (100) with 95 eV beam energy. -95_eV.jpg)
Figure 6. LEED pattern of Silicon Carbide 6H (0001) with Titanium (estimated deposited layer thickness of 56.0mm) with 130 eV beam energy. -130_eV.jpg)
Figure 7. LEED pattern of Yttrium Iron Garnet with 15 eV beam energy. 
Figure 8. Auger Spectrum of Silicon Carbide 6H with Titanium. 
Figure 9. Auger spectrum of Yttrium Iron Garnet. 
The LEED 800 with integral shutter has LEED and AES capabilities using a miniature electron gun, set of concentric grids and a conductive, phosphor coated screen. It is an extremely reliable high-performance LEED instrument which operates with up to date digital power supply. The retraction mechanism has outstanding mechanical properties ensuring smooth day-to-day operation as experienced by our large user base over decades. The LEED 800 delivers exceptionally sharp and bright LEED patterns with high resolution in k-space (typical transfer width of 300 Å at 100 eV). The wide viewing angle (100° at 75mm sample distance) and minimal shadowing of the screen by the miniature electron gun give a maximum visible LEED pattern. For details, visit the LEED 800 Product Page.
Features
- High energy & image resolution for LEED and AES with no Moire pattern interference
- Large Angle (100°) Fluorescent LEED Display and superior magnetic shielding
- Miniature electron gun with large coherence width and dual lenses
- Suitable for in-situ film growth monitoring
- Low outgassing rate
- Convenient LEED Image Capture with External CCD Camera
- Simple and Powerful Operation with Digital Controller
Specifications, Configuration and More
LEED 600 (Model BDL600IR)
Compact LEED to fit smaller UHV Systems
Figure 2. Model LPS075-D power supply for LEED operation. 
Figure 3. Model LPS300-D and LOA10-AES power supply for LEED and AES operation. 
Figure 4. MultiLEED Software.
Figure 5. AES Software.
Figure 5. AES Software Images - element composition. 
Figure 6. LEED pattern of Komori Si(111) t51 sample. 
Figure 7. Ni (100): a) 110 eV b) O2 reconstruction c) H2 reconstruction. 
Figure 8. Auger spectrum of Iron (thick layer) on Magnesium Oxide. 
Figure 9. Auger spectrum of Silicon (111). 
The LEED 600 with integral shutter has LEED and AES capabilities using a miniature electron gun, set of concentric grids and a conductive, phosphor coated screen. It is an extremely reliable high-performance LEED instrument which operates with up to date digital power supply. The retraction mechanism has outstanding mechanical properties ensuring smooth day-to-day operation as experienced by our large user base over decades. The wide viewing angle (90° at 51mm sample distance) and minimal shadowing of the screen by the miniature electron gun give a maximum visible LEED pattern. For details, visit the LEED 600 Product Page.
Features
- High energy & image resolution for LEED and AES with no Moire pattern interference
- Large Angle (90°) Fluorescent LEED Display and superior magnetic shielding
- Miniature electron gun with large coherence width and dual lenses
- Suitable for in-situ film growth monitoring
- Low outgassing rate
- Convenient LEED Image Capture with External CCD Camera
- Simple and Powerful Operation with Digital Controller
Specifications, Configuration and More
LEED 800 MCP (Model BDL800IR-MCP)
Organic Films & Molecular Beam Epitaxy
Figure 2. Model LPS075-D power supply for LEED operation. 
Figure 3. Model LPS300-D and LOA10-AES power supply for LEED and AES operation. 
Figure 4. Model MCPS01/02 power supply for microchannel plate operation. 
Figure 5. MultiLEED Software. 
Figure 6. AES Software. 
Figure 6. AES Software Images - element composition. 
Figure 7. LEED pattern of Germanium (100) with 120 eV beam energy. 
Figure 8. LEED pattern of Gallium Nitride (0001) with 64 eV beam energy. 
Figure 9. BP4 on Au (111) with 64 eV beam energy. -64eV.jpg)
Figure 10. BP3 on Au (111) with 69 eV beam energy. -69eV.jpg)
Figure 11. Auger spectrum of Gallium Nitride. 
Figure 12. Auger spectrum of Gold. 
The LEED 800 MCP with integral shutter has LEED and AES capabilities using a miniature electron gun, set of concentric grids and a conductive, phosphor coated screen. In addition, this optic model incorporates the high gain of microchannel plates. It is an extremely reliable high-performance LEED instrument which operates with up to date digital power supply. The retraction mechanism has outstanding mechanical properties ensuring smooth day-to-day operation as experienced by our large user base over decades. The wide viewing angle (101° at 75mm sample distance) and minimal shadowing of the screen by the miniature electron gun give a maximum visible LEED pattern. For details, visit the LEED 800 MCP Product Page.
Features
- High Image Sensitivity at the Primary Beam Current – 50 pA
- Single/Dual 75 mm Microchannel Plates
- AES at Beam Current 50 µA – 10 µA
- Large Angle (101°) Fluorescent LEED Display and superior magnetic shielding
- Miniature electron gun with large coherence width and dual lenses
- Suitable for ESDIAD
- Convenient LEED Image Capture with External CCD Camera
- Simple and Powerful Operation with Digital Controller
Specifications, Configuration and More
LEED 600 MCP (Model BDL600IR-MCP)
Compact LEED for Organic Films & Molecular Beam Epitaxy
Figure 2. Model LPS075-D power supply for LEED operation. 
Figure 3. Model LPS300-D and LOA10-AES power supply for LEED and AES operation. 
Figure 4. Model MCPS01/02 power supply for microchannel plate operation. 
Figure 5. MultiLEED Software. 
Figure 6. AES Software. 
Figure 6. AES Software Images - element composition. 
Figure 7. LEED pattern of Silicon (111) with 80 eV beam energy. 
Figure 8. Auger spectrum of Silicon (111). 
The LEED 600 MCP has LEED and AES capabilities using a miniature electron gun, set of concentric grids and a conductive, phosphor coated screen. In addition, this optic model incorporates the high gain of microchannel plates. It is an extremely reliable high-performance LEED instrument which operates with up to date digital power supply. The retraction mechanism has outstanding mechanical properties ensuring smooth day-to-day operation as experienced by our large user base over decades. The wide viewing angle (92° at 51mm sample distance) and minimal shadowing of the screen by the miniature electron gun give a maximum visible LEED pattern. For details, visit the LEED 600 MCP Product Page.
Features
- High Image Sensitivity at the Primary Beam Current – 50 pA
- Single/Dual 75 mm Microchannel Plates
- AES at Beam Current 50 µA – 10 µA
- Large Angle (92°) Fluorescent LEED Display and superior magnetic shielding
- Miniature electron gun with large coherence width and dual lenses
- Suitable for ESDIAD
- Convenient LEED Image Capture with External CCD Camera
- Simple and Powerful Operation with Digital Controller
Specifications, Configuration and More
LEED 450 (Model BDL450)
Miniature Instrument to Fit Any UHV System
Figure 2. Model LPS075-D power supply for LEED operation. 
Figure 3. Model LPS300-D and LOA10-AES power supply for LEED and AES operation. 
Figure 4. MultiLEED Software. 
Figure 5. AES Software. 
Figure 5. AES Software Images - element composition. 
Figure 6. LEED pattern of a CuAl (111) sample with 125 eV beam energy. 
Figure 7. LEED pattern of CuAl (111) with 108 eV beam energy. 
Figure 8. LEED pattern of CuAl (111) with 22-108 eV beam energy. 
Figure 9. EED pattern of Graphene on Iridium (111) with 74 eV beam energy. 
Figure 10. Auger spectrum of TiO2. 
Figure 11. Auger spectrum of SrTiO3. 
The LEED 450 with integral shutter has LEED and AES capabilities using a miniature electron gun, set of concentric grids and a conductive, phosphor coated screen. It is an extremely reliable high-performance LEED instrument which operates with up to date digital power supply. The wide viewing angle (90° at 32mm sample distance) and minimal shadowing of the screen by the miniature electron gun give a maximum visible LEED pattern. For details, visit the LEED 450 Product Page.
Features
- Large Angle (90°) Fluorescent LEED Display and superior magnetic shielding
- Miniature electron gun with large coherence width and dual lenses
- Suitable for in-situ film growth monitoring
- Low outgassing rate
- Convenient LEED Image Capture with External CCD Camera
- Simple and Powerful Operation with Digital Controller
Specifications, Configuration and More
LEED 450-MAX (Model BDL450-MAX)
with Intergral Retraction and Shutter
Based on Low Energy Electron Diffraction (LEED) and Auger Electron Spectroscopy (AES)
Miniature model with maximized display for basic surface crystallography of single crystals and "in-situ" epitaxy. The LEED 450-MAX is capable of providing LEED and AES data for a wide range of samples. The miniature instrument size allows for easy installation to smaller UHV systems. Materials suitable for charaterization should be single crystals and epitaxial films in categories such as: 2D materials, semiconductors, metals, oxides and magnetic films. For details, visit the LEED 450-MAX Product Page.
- Sufficient angular and energy resolution to detect surface reconstructions and composition changes
- Miniature electron gun with double focusing
- Superior magnetic shielding
- Moiré pattern reduction
- Suitable for "in situ" growth monitoring
- Integral linear motion and shutter
- Low outgassing rate
- Easy add-on AES
Specifications, Configuration and More
FemtoLEED DLD L800
Nano-Scale Measurements of Surface Periodic Structures with Femto-Ampere Electron Probe
Figure 2. LPS-D power supply for LEED & microchannel plate power supply MCPS01/02. 
Figure 3. Silicon (111) with 50 eV beam energy, 35 V GND. 
Figure 4. Silicon sample (185 deg) with 10 eV beam energy. 
Figure 5. Magnesium Oxide sample. 
Figure 6. Magnesium Oxide (100) with 94 eV beam energy. -94eV.jpg)
Collaboration with RoentDek in Germany.
The FemtoLEED with integral shutter enables nano-scale measurements of surface periodic structures with a femto-ampere electron probe. Instead of a fluorescent screen, it uses a delay line detector and allows for fully digital operation.
With its primary electron beam in the range of femto ampere, the FemtoLEED DLD L800 is specifically useful for investigations on sensitive organic samples. The fully digital system negates the need for an external CCD camera for live image capture. For details, visit the FemtoLEED DLD L800 Product Page.
Features
- Primary electron beam in the range of femto ampere
- Electron diffraction on insulating single crystal samples
- Large coherence width
- Powerful operation with digital LEED controller
Specifications, Configuration and More
FemtoLEED DLD L1000
Ultra-Sensitive and Insulating Film Crystallography
Figure 2. LPS-D power supply for LEED & microchannel plate power supply MCPS01/02.
Figure 3. Silicon (111) with 35 eV beam energy. 
Figure 4. Silicon (111) with 140 eV beam energy. 
Figure 5. Germanium (001) with 136 eV beam energy. 
Figure 6. Germanium (001) with 200 eV beam energy. 
Collaboration with RoentDek in Germany.
Description
The FemtoLEED DLD L1000 with integral shutter enables measurements of ultra-sensitive and insulating films. Instead of a fluorescent screen, it uses a delay line detector which allows for fully digital operation. The hex-anode provides minimized blind area due to the redundant detection opportunities of the added third delay line layer.
For details, visit the FemtoLEED DLD L1000 Product Page.
Features
- Fully digital
- Minimized blind area
- Electron diffraction on insulating single crystal samples
- Large coherence width
- Powerful operation with digital LEED controller
Specifications, Configuration and More
NDC600
Nano-Depth Composition Analyzer
based on Auger Electron Spectroscopy (AES)
Model NDC600
Description
Model NDC600 analyzer is the single stage cylindrical mirror analyzer (CMA) comprising of an axial miniature electron gun with robust tungsten filament. The energy resolution of the analyzer is 0.5 %. The signal detector is based on cylindrical slit followed by channel electron multiplier with gain greater than 3x10-7.
The high elemental sensitivity is achieved by combination of high gain - low noise Channeltron TM operated with sophisticated external bandpass filter for Auger signal processing. The Auger's signal detection is from 0.1 nm to 5 nm depth at the substrate surface.
For details, visit the NDC600 Product Page.
Features
- High Surface Elemental Sensitivity
- Small Beam Size
- Suitable for Depth Profiling
- Adjustment for Sample Positioning & Retraction
- Compact Design