ocivm.com > LEED / AES Spectrometers > mini-LEED with Integral Shutter: LEED 450-MAX (Model BDL450-MAX)

Surface Crystallography Spectrometer - IntegraLEED

Based on Low Energy Electron Diffraction (LEED) and Auger Electron Spectroscopy (AES)

LEED 450-MAX (Model BDL450-MAX)

with Intergral Retraction and Shutter

Miniature model with maximized display for basic surface crystallography of single crystals and "in-situ" epitaxy. The LEED 450-MAX is capable of providing LEED and AES data for a wide range of samples. The miniature instrument size allows for easy installation to smaller UHV systems. Materials suitable for charaterization should be single crystals and epitaxial films in categories such as: 2D materials, semiconductors, metals, oxides and magnetic films.

For more information such as Ordering Guide, Control Electronics, LEED Software & CCD Camera Specifications, download the LEED 450-MAX brochure.


Features

  • Sufficient angular and energy resolution to detect surface reconstructions and composition changes
  • Miniature electron gun with double focusing
  • Superior magnetic shielding
  • MoirĂ© pattern reduction
  • Suitable for "in situ" growth monitoring
  • Integral linear motion and shutter
  • Low outgassing rate
  • Easy add-on AES

Applications

Miniature model with maximized display for basic surface crystallography of single crystals and "in-situ" epitaxy. The LEED 450-MAX is capable of providing LEED and AES data for a wide range of samples. The miniature instrument size allows for easy installation to smaller UHV systems. Materials suitable for charaterization should be single crystals and epitaxial films in categories such as: 2D materials, semiconductors, metals, oxides and magnetic films.

Drawings

For seamless integration, 3D step files are available for all models.

Schematic, Side View, LEED 450-MAX (Model BDL450-MAX).

Calculation formula for flange sample distance & retraction length for LEED 450-MAX (BDL450-MAX):
FS = 159mm + 2LMX - OV; where FS is the flange to sample distance, LMX is the retraction length, OV is the overlapping length, PL is the port length and NL is the nipple length.

Schematic, Side View, Example 1. LEED 450-MAX (Model BDL450-MAX).
Schematic, Side View, Example 2. LEED 450-MAX (Model BDL450-MAX).
Schematic, Side View, Example 3. LEED 450-MAX (Model BDL450-MAX).

Key Specifications

For Ordering Guide, Control Electronics, Software & CCD Camera Specifications, download the PDF brochure.

LEED-AUGER-Optics
Retarding Field Analyzer Concentric assembly of hemispherical grids working distance from sample 10mm
Grid Material Gold coated tungsten wire mesh (100 mesh, 81% transparency)
Energy Resolution 0.2% - 0.5% at low modulation volt
Glass-Display Fused silica glass coated with indium-tin oxide conductive layer and P31 phosphor (ZnS:Ag:Cu-green, 525 nm wavelength) 90 ° angle of acceptance from sample at a distance of 38 mm
Monitoring Linear Motion Standard viewport on CF4.5" (DN63CF) flange Up to 150 mm retraction from sample (100 mm standard); linear ball bearing and acme thread with all spring electrical connections
Integral Shutter Open and close at any position of the linear motion
Magnetic Shielding Mu-metal cylinder with front cover for maximum magnetic field attenuation
Assembly Extreme-high-vaccum compatibility with stainless steel, high alumina and gold-plated copper alloy materials
Mounting CF4.5" (DN63CF) with oversized tubing: 76mm (3") O.D.
Bakeability Under vacuum, 250 °C maximum
INTEGRAL MINIATURE ELECTRON GUN
Beam Energy LEED: 5 eV to 750 eV • AES: 5 eV to 3000 eV
Beam Current LEED: 2 µA at 100 eV and 0.5 mm
AES: up to 100 µA at 3keV
Beam Size 1mm to 250 µm - adjusted by wehnelt voltage
Electron Source Tungsten-2%Thoriated filament standard, single crystal LaB6 filament optional
Energy Spread Overall Size 0.45 eV (thoriated-tungsten filament)
10mm lens diameter and 80 mm length

Brochure