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Low Energy Electron Diffraction & Auger Electron Spectroscopy Data

Crystal Substrates > Ni (100) - Nickel

Substrate Specifications

  • Material: Nickel
  • Size: 5 mm x 5 mm x 0.5 mm
  • Orientation: (100)
  • Structure: Face-centered Cubic
  • Lattice Constant: 3.25 Å
  • Type/Dopant: Undoped
  • Growth Method: Not Stated
  • Melting Temperature: 1455 °C
  • Debye Temperature: (at 24.85 °C) 71.85 °C [Ref. 11]
  • Surface Debye Temperature: 216 ± 10K or around -57.15 °C (for 110 Orientation) [Ref. 12]
  • Characterization Tool: LEED-AES
    Model: BDL800IR
  • UHV Treatment: Annealing at 400 °C and 680 °C (estimated sample temperatures) each for 30 seconds
  • Applications: Many high technology uses including those in electronics and optics [Ref. 13]

LEED Patterns

Annealed at 400 °C for 30 Seconds

Ni (100) - LEED Pattern 90 eV at 400°C
Ni (100) - LEED Pattern 90 eV at 400 °C
Ni (100) - LEED Pattern 110 eV at 400°C
Ni (100) - LEED Pattern 110 eV at 400 °C
Ni (100) - LEED Pattern 210 eV at 400°C
Ni (100) - LEED Pattern 210 eV at 400 °C

Annealed at 680 °C for 30 Seconds

Ni (100) - LEED Pattern 90 eV at 680°C
Ni (100) - LEED Pattern 90 eV at 680 °C
Ni (100) - LEED Pattern 110 eV at 680°C
Ni (100) - LEED Pattern 110 eV at 680 °C
Ni (100) - LEED Pattern 210 eV at 680°C
Ni (100) - LEED Pattern 210 eV at 680 °C

Ni 100 - AES Spectrum

Ni 100 - AES Spectrum
Ni 100 – AES Spectrum

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