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Low Energy Electron Diffraction & Auger Electron Spectroscopy Data

Crystal Substrates > LaAlO3 - Lanthanum Aluminate

  • Material: Lanthanum Aluminate
  • Size:
  • Orientation:
  • Structure: Cubic
  • Lattice Constant: a = b = c = 3.811 Å
  • Type/Dopant:
  • Growth Method: Czochralski
  • Melting Temperature: 2453 K
  • Debye Temperature: 720 ± 22 K [Ref. 37]
  • Surface Debye Temperature: Unpublished
  • Characterization Tool: LEED-AES
    Model BDL800IR
  • UHV Treatment: Annealing
  • Applications: used as a substrate when depositing thin films for magnetic devices [Ref. 36]

LEED Patterns

LaAlO3 - LEED Pattern 100 eV
LaAlO3 - LEED Pattern 100 eV
LaAlO3 - LEED Pattern 120 eV
LaAlO3 - LEED Pattern 120 eV
LaAlO3 - LEED Pattern 155 eV
LaAlO3 - LEED Pattern 155 eV

LaAlO3 - AES Spectrum

Ga2O3-β (201) - AES Spectrum
LaAlO3 - AES Spectrum

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