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Joseph Ociepa at the University of Wroclaw in Poland in 1981
1981 at the University of Wroclaw in Poland
2014 at the OCI Vacuum Microengineering facility in London, Ontario
2014 at OCI Vacuum Microengineering facility in London, Ontario, Canada
The OCI Vacuum Microengineering team.
The OCIVM team / Integrated MBE system with 7 deposition sources and in-situ characterization, 2016

Our Story

The world of technology is evolving due to new applications of physics and chemistry laws which remain constant. Our company's continuous dedication to physics based products allows us to participate in this process by developing state-of-the art instrumentation for characterization and synthesis of nanoscale materials.

OCI Vacuum Microengineering, Inc. was founded in 1990 by Jozef G. Ociepa in London, Ontario to commercialize surface science analytical instrumentation including low energy electron diffraction (LEED) and Auger electron spectroscopy (AES).

From the onset of his career, Dr. Jozef Ociepa has been involved with surface science and instrument fabrication surrounding this field. While completing his PhD work, he constructed a glass reverse view LEED-AES apparatus. He studied under Prof. Stefan Mroz who pioneered this technique in Poland.

Dr. Ociepa completed his PhD in 1981 at the University of Wroclaw in Poland and then continued post-doctoral research at Clausthal Unversity in Germany under Professor Ernest Bauer. In 1986, Dr. Ociepa moved to Canada and worked as a post-doctoral fellow at the University of Manitoba and the University of Western Ontario.

Today, OCI Vacuum Microengineering, Inc. continues with a commitment to research, development and production of high quality analytical instrumentation as well as striving to provide exceptional customer service.

Product Development Timeline

  • 1990 - LEED-AES Optics
  • 1995 - LEED-AES Software
  • 1997 - Auger Depth Profiling
  • 1998 - MCP-LEED Optics
  • 2002 - Digital Controller
  • 2006 - FemtoLEED
  • 2008 - Mini-LEED
  • 2012 - UHV-LEED-AES System, Spherical chamber 18" (400mm), Large samples characterization- 2" (50mm)
  • 2016 - Integrated MBE system with in-situ characterization tools: LEED-AES, RHEED and XPS, 7 deposition sources